URI https://d-nb.info/gnd/6084052-3
EntitätstypKonferenz oder Veranstaltung
GND-Nummer6084052-3
LändercodeUSA 
Veranstaltungsdaten2003
VeranstaltungsortSan Diego, Calif. 
Varianter NameAnnual Conference on Advanced Characterization Techniques for Optics, Semiconductors, and Nanotechnologies (2003 : San Diego, Calif.) | Annual SPIE Conference on Advanced Characterization Techniques for Optics, Semiconductors, and Nanotechnologies (2003 : San Diego, Calif.) | SPIE Conference on Advanced Characterization Techniques for Optics, Semiconductors, and Nanotechnologies (2003 : San Diego, Calif.)
Siehe auchDeutsche Nationalbibliothek (DNB) Deutsche Nationalbibliothek (DNB) | Virtual International Authority File (VIAF) Virtual International Authority File (VIAF)

Datenquelle: DNB Linked-Data-Service (RDF/XML, Turtle) | CC0

Datenquelle: DNB Linked-Data-Service (RDF/XML, Turtle) | CC0